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Volumn 25, Issue 1, 2010, Pages 16-23

SiC wirebond multichip phase-leg module packaging design and testing for harsh environment

Author keywords

High temperature packaging; SiC devices

Indexed keywords

A-THERMAL; FEASIBLE SOLUTION; HARSH ENVIRONMENT; HIGH TEMPERATURE; HIGH-TEMPERATURE PACKAGING; JUNCTION TEMPERATURES; MODULE PACKAGING; MULTI-CHIP; POWER MODULE; SEALING MATERIAL; SIC DEVICES; TEMPERATURE EXCURSIONS; THERMAL RELIABILITY; THERMOMECHANICAL RELIABILITY; WIREBOND;

EID: 76649133450     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2009.2027324     Document Type: Article
Times cited : (91)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.