Focusing XFEL SASE pulses by rotationally parabolic refractive x-ray lenses

Journal of Physics: Conference Series

Volumn 499, Issue 1, 2014, Pages

  Seiboth, Frank ^a   Schropp, Andreas ^a,b   Hoppe, Robert ^a   Meier, Vivienne ^a   Patommel, Jens ^a   Lee, Hae Ja ^b   Nagler, Bob ^b   Galtier, Eric C ^b   Arnold, Brice ^b   Zastrau, Ulf ^b   Hastings, Jerome B ^b   Nilsson, Daniel ^c   Uhlén, Fredrik ^c   Vogt, Ulrich ^c   Hertz, Hans M ^c   Schroer, Christian G ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ELECTRON PROBE MICROANALYSIS; ELECTRONS; FREE ELECTRON LASERS; LIGHT SOURCES; MICROANALYSIS; OPTICAL INSTRUMENT LENSES; X RAY LITHOGRAPHY; X RAY OPTICS;

CHROMATIC ABERRATION; CRYSTAL MONOCHROMATORS; LENS MATERIALS; LINAC COHERENT LIGHT SOURCE; NANO-FOCUSING; PARABOLIC REFRACTIVE X-RAY LENS; REFRACTIVE X-RAY LENS; SELF-AMPLIFIED SPONTANEOUS EMISSION;

ABERRATIONS;

EID: 84899584839     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/499/1/012004     Document Type: Conference Paper

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