Scanning coherent x-ray microscopy as a tool for XFEL nanobeam characterization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8849, Issue , 2013, Pages

  Schropp, Andreas ^a,c   Hoppe, Robert ^a   Patommel, Jens ^a   Seiboth, Frank ^a   Uhlén, Fredrik ^b   Vogt, Ulrich ^b   Lee, Hae Ja ^c   Nagler, Bob ^c   Galtier, Eric C ^c   Zastrau, Ulf ^c   Arnold, Brice ^c   Heimann, Philip ^c   Hastings, Jerome B ^c   Schroer, Christian G ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

Coherent x ray imaging; Compound refractive lenses; Ptychography; X ray free electron laser; X ray optics

Indexed keywords

COMPUTER GRAPHICS; COMPUTER GRAPHICS EQUIPMENT; ELECTRON SOURCES; FREE ELECTRON LASERS; LIGHT SOURCES; NANOWIRES; OPTICAL INSTRUMENT LENSES; PROGRAM PROCESSORS; X RAY APPARATUS; X RAY MICROSCOPES;

COHERENT X-RAYS; COMPLETE INFORMATION; COMPOUND REFRACTIVE LENS; GRAPHICS PROCESSING UNIT; HIGH SPATIAL RESOLUTION; LINAC COHERENT LIGHT SOURCE; PTYCHOGRAPHY; X-RAY FREE ELECTRON LASERS;

X RAY OPTICS;

EID: 84888866822     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2024784     Document Type: Conference Paper

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