Optimization of multilayer Laue lenses for a scanning X-ray microscope

Journal of Synchrotron Radiation

Volumn 20, Issue 1, 2013, Pages 89-97

  Yan, Hanfei ^a   Chu, Yong S ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

apodization; monochromaticity; multilayer Laue lens; nanofocusing; X ray

Indexed keywords

APODIZATIONS; BEAM LINES; HARD X RAY; MONOCHROMATICITY; MULTILAYER LAUE LENS; NANO-FOCUSING; NANO-METER SCALE; NATIONAL SYNCHROTRON LIGHT SOURCES; NM RESOLUTION; OPTIMIZED USE; SCANNING X-RAY MICROSCOPES; WORKING DISTANCES;

MULTILAYERS; OPTIMIZATION; X RAY MICROSCOPES;

X RAYS;

EID: 84871446753     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049512044883     Document Type: Article

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