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Volumn 32, Issue 1, 2014, Pages

Kinetic study on hot-wire-assisted atomic layer deposition of nickel thin films

Author keywords

[No Author keywords available]

Indexed keywords

CARBON CONTAMINATION; DEPOSITION PROCESS; DEPOSITION TEMPERATURES; IMPURITY CONTENT; LANGMUIR-TYPE MODEL; NICKEL THIN FILM; PLASMA-INDUCED DAMAGE; RADICAL GENERATION;

EID: 84891776293     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.4829361     Document Type: Article
Times cited : (21)

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    • (in press)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.