Hydrogen passivation of B-O defects in Czochralski silicon

Energy Procedia

Volumn 38, Issue , 2013, Pages 561-570

  Hallam, Brett J ^a   Wenham, Stuart R ^a   Hamer, Phillip G ^a   Abbott, Malcolm D ^a,b   Sugianto, Adeline ^a   Chan, Catherine E ^a   Wenham, Alison M ^a   Eadie, Mitchell G ^a   Xu, Guang Qi ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b Suntech Power Holdings Co Ltd   (China)

Author keywords

Boron oxygen defect; Czochralksi silicon; Hydrogen passivation; Light induced degradation

Indexed keywords

EID: 84891558832     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2013.07.317     Document Type: Conference Paper

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