Minority carrier lifetime degradation in boron-doped Czochralski silicon

Journal of Applied Physics

Volumn 90, Issue 5, 2001, Pages 2397-2404

  Glunz, S W ^a   Rein, S ^a   Lee, J Y ^a   Warta, W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040028982     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1389076     Document Type: Article

References (27)

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