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Volumn 16, Issue 2, 2008, Pages 135-140

Investigations on the long time behavior of the metastable boron-oxygen complex in crystalline silicon

Author keywords

Boron oxygen; Czochralski; Defect; Degradation; Lifetime; Silicon

Indexed keywords

BORON COMPOUNDS; CONTAMINATION; CRYSTAL GROWTH FROM MELT; CRYSTALLINE MATERIALS; DEFECTS; DEGRADATION; SILICON COMPOUNDS;

EID: 41049105821     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.779     Document Type: Article
Times cited : (153)

References (17)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.