Quantitative correlation of the metastable defect in CZ-silicon with different impurities

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn B, Issue , 2003, Pages 1048-1052

  Rein, S ^a   Diez, S ^a   Falster, R ^b   Glunz, S W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^b MEMC Electronic Materials SpA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT CONCENTRATION; METASTABLE DEFECTS; MICROSCOPIC STRUCTURES; QUANTITATIVE CORRELATIONS;

BORON; CORRELATION METHODS; DOPING (ADDITIVES); FOURIER TRANSFORM INFRARED SPECTROSCOPY; IMPURITIES; MATHEMATICAL MODELS; OXYGEN; PHOTOCONDUCTING DEVICES;

SILICON;

EID: 6344254783     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. S.W. Glunz, S. Rein, W. Warta, J. Knobloch, et al., Proc. 2nd WCPEC (Vienna, Austria, 1998), p. 1343-6.
2. J. Schmidt, K. Bothe, and R. Hezel, Proc. 29th IEEE PVSC (New Orleans, Louisiana, USA, 2002), p. 178.
3. S. Rein, J. Knobloch, and S.W. Glunz, Proc. 16th EPVSEC (Glasgow, UK, 2000), p. 1201-5.
4. H. Nagel, A. Merkle, A. Metz, and R. Hezel, Proc. 16th EPVSEC (Glasgow, UK, 2000), p. 1197-200.
5. S. Rein, T. Rehrl, W. Warta, S.W. Glunz, et al., Proc. 17th EPVSEC (Munich, Germany, 2001), p. 1555-60.
6. R. Falster, V.V. Voronkov, and F. Quast, Physica Status Solidi B 222 (1), 219-44 (2000).
7. G.E.P. Box, W.G. Hunter, and J.S. Hunter, Statistic for Experimenters: An Introduction to Design, Data Analysis and Model Building (John Wiley & Sons, 1978).