Electrical characterization of perovskite nanostructures by SPM

Scanning Probe Microscopy

Volumn 2, Issue , 2007, Pages 746-775

  Szot, K ^a,b   Reichenberg, B ^c   Peter, F ^b   Waser, R ^b   Tiedke, S ^c  

^a UNIVERSITY OF SILESIA   (Poland)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c AIXACCT SYSTEMS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84891428775     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-0-387-28668-6_28     Document Type: Chapter

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