Investigation of the current path of Pb(Zr,Ti)O3 thin films using an atomic force microscope with simultaneous current measurement

Applied Physics Letters

Volumn 71, Issue 3, 1997, Pages 416-418

  Fujisawa, Hironori ^a   Shimizu, Masaru ^a   Horiuchi, Toshihisa ^b   Shiosaki, Tadashi ^b   Matsushige, Kazumi ^b  

^a UNIVERSITY OF HYOGO   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT MEASUREMENT; GRAIN BOUNDARIES; LEAD COMPOUNDS; SURFACE STRUCTURE; THICKNESS MEASUREMENT; THIN FILMS;

CONDUCTIVE CANTILEVER; CURRENT PATH; LEAD ZIRCONIUM TITANATE; SURFACE TOPOGRAPHY;

SUPERCONDUCTING FILMS;

EID: 0031187596     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119327     Document Type: Article

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