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Volumn 73, Issue 10, 1998, Pages 1361-1363

Cold-field-emission test of the fatigued state of Pb(ZrxTi1-x)O3 films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000905009     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122374     Document Type: Article
Times cited : (47)

References (15)
  • 7
    • 4243514069 scopus 로고
    • Van Nostrand Reinhold, New York
    • K. Böer, Survey of Semiconductor Physics (Van Nostrand Reinhold, New York, 1992), Vol. II, p. 359.
    • (1992) Survey of Semiconductor Physics , vol.2 , pp. 359
    • Böer, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.