Improved PbZr0.52Ti0.48O3 film quality on SrRuO3/SrTiO3 substrates

Journal of Crystal Growth

Volumn 277, Issue 1-4, 2005, Pages 210-217

  Rodriguez Contreras J ^a   Kohlstedt, H ^a   Petraru, A ^a   Gerber, A ^a   Hermanns, B ^a   Haselier, H ^a   Nagarajan, N ^a   Schubert, J ^a   Poppe, U ^a   Buchal, Ch ^a   Waser, R ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

A1. Crystal morphology; B1. Perovskite; B2. Ferroelectric materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; FERROELECTRICITY; LATTICE CONSTANTS; PEROVSKITE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTERING; STOICHIOMETRY; SUBSTRATES; THIN FILMS;

CRYSTAL MORPHOLOGY; CRYSTALLOGRAPHIC STRUCTURES; DEPOLARIZATION FIELDS; FERROELECTRIC TUNNEL JUNCTIONS; METAL ELECTRODE;

STRONTIUM COMPOUNDS;

EID: 20144380675     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.12.137     Document Type: Article

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