SCOPUS 정보 검색 플랫폼

Scanning Probe Microscopies Beyond Imaging: Manipulation of Molecules and Nanostructures

Volumn , Issue , 2006, Pages 315-353

Atomic Force Microscopy-Based Single-Molecule Force Spectroscopy of Synthetic Supramolecular Dimers and Polymers

(3) Zou, Shan a Schönherr, Holger b Julius Vancso, G b

Author keywords

electron stacking; AFM based single molecule force spectroscopy (SMFS); Atomic force microscopy based single molecule force spectroscopy; Charge transfer complexes; Metal mediated coordination interactions; Rupture bonds; SMFS of synthetic supramolecular dimers and polymers; Supramolecular interactions; Synthetic supramolecular dimers and polymers

Indexed keywords

EID: 84891001219 PISSN: None EISSN: None Source Type: Book
DOI: 10.1002/3527608516.ch11 Document Type: Chapter

Times cited : (8)

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