Effect of film thickness on properties of aluminum doped zinc oxide thin films deposition on polymer substrate

Journal of Materials Science: Materials in Electronics

Volumn 24, Issue 12, 2013, Pages 5091-5096

  Akin, Nihan ^a   Sebnem Cetin, S ^a   Cakmak, Mehmet ^a   Memmedli, Tofig ^a   Ozcelik, Suleyman ^a  

^a GAZI UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM-DOPED ZINC OXIDE THIN FILMS; HALL EFFECT MEASUREMENT; HEXAGONAL STRUCTURES; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL ENERGY BAND GAP; PREFERRED ORIENTATIONS; RADIO FREQUENCY MAGNETRON SPUTTERING METHOD; X RAY DIFFRACTOMETERS;

DEPOSITION; OPTICAL FILMS; SUBSTRATES; THIN FILMS;

ELECTRIC PROPERTIES;

EID: 84890390812     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-013-1528-0     Document Type: Article

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