Thickness effect on the evolution of morphology and optical properties of ZnO films

Applied Surface Science

Volumn 257, Issue 9, 2011, Pages 4051-4055

  Zhong, Aihua ^a   Tan, Jin ^a   Huang, Huali ^a   Chen, Shengchang ^a   Wang, Man ^a   Xu, Sai ^a  

^a CHINA UNIVERSITY OF GEOSCIENCES   (China)

Author keywords

Film thickness; Morphology; Photoluminescence; ZnO films

Indexed keywords

ALUMINUM COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; FILM THICKNESS; II-VI SEMICONDUCTORS; METALLIC FILMS; MORPHOLOGY; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; SPRAY PYROLYSIS; SUBSTRATES; X RAY DIFFRACTION; ZINC OXIDE;

DEFECTS EMISSIONS; DISTRIBUTION OF ELEMENT; ENERGY DISPERSIVE X RAY SPECTROSCOPY; EVOLUTION OF MORPHOLOGIES; FIELD EMISSION SCANNING; PHOTOLUMINESCENCE PROPERTIES; ULTRASONIC SPRAY PYROLYSIS; ZNO FILMS;

NITROGEN COMPOUNDS;

EID: 78951491759     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.11.173     Document Type: Article

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