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Volumn 114, Issue 17, 2013, Pages

Polarity determination of polar and semipolar (112̄2) InN and GaN layers by valence band photoemission spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); NONDESTRUCTIVE METHODS; POLARITY DETERMINATION; SIGNIFICANCE LEVELS; SURFACE OXIDATIONS; VALENCE BAND PHOTOEMISSION SPECTROSCOPIES; VALENCE BAND STATE; X RAY PHOTOEMISSION SPECTROSCOPY;

EID: 84888394183     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4828487     Document Type: Article
Times cited : (33)

References (44)
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    • 10.1016/0304-3991(87)90080-5
    • P. A. Stadelmann, Ultramicroscopy 21, 131-145 (1987). 10.1016/0304-3991(87)90080-5
    • (1987) Ultramicroscopy , vol.21 , pp. 131-145
    • Stadelmann, P.A.1
  • 39
    • 0000970991 scopus 로고    scopus 로고
    • 10.1063/1.362924
    • V. M. Bermudez, J. Appl. Phys. 80, 1190 (1996). 10.1063/1.362924
    • (1996) J. Appl. Phys. , vol.80 , pp. 1190
    • Bermudez, V.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.