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Volumn 9, Issue 3-4, 2012, Pages 977-981

Comparison study of N- and In-polar {0001} InN layers grown by MOVPE

Author keywords

MOVPE InN; Photoluminescence; Polarity

Indexed keywords

COMPARISON STUDY; CRYSTALLINITIES; GAN TEMPLATE; GROWTH MODES; INN LAYERS; LOW TEMPERATURE PHOTOLUMINESCENCE; METAL-ORGANIC VAPOR PHASE EPITAXY; N-POLAR; PLANE SAPPHIRE; POLARITY;

EID: 84858838048     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.201100093     Document Type: Article
Times cited : (6)

References (21)
  • 12
    • 84858824042 scopus 로고    scopus 로고
    • Elements of X-ray Diffraction, 3rd ed. (Prentice-Hall Inc.
    • B. D. Cullity and S. R. Stock, Elements of X-ray Diffraction, 3rd ed. (Prentice-Hall Inc., 2001), pp. 167-171.
    • (2001) , pp. 167-171
    • Cullity, B.D.1    Stock, S.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.