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Volumn 76, Issue 6, 1997, Pages 1215-1234

Polarity of epitaxial layers and (1210)prismatic defects in GaN and AlN grown on the (0001)si surface of 6H-SiC

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0038877314     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619708214224     Document Type: Article
Times cited : (62)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.