Analysis of polar GaN surfaces with photoelectron and high resolution electron energy loss spectroscopy

Physica Status Solidi (B) Basic Research

Volumn 247, Issue 7, 2010, Pages 1658-1661

  Lorenz, Pierre ^a   Haensel, Thomas ^a   Gutt, Richard ^b   Koch, Roland J ^a   Schaefer, Juergen A ^a   Krischok, Stefan ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

Author keywords

Electron energy loss spectroscopy; III V semiconductors; Photoemission

Indexed keywords

EID: 77954600935     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200983691     Document Type: Article

References (25)

1. O. Ambacher, J. Smart, J. R. Shealy, N. G. Weimann, K. Chu, M. Murphy, W. J. Schaff, L. F. Eastman, R. Dimitrov, L. Wittmer, M. Stutzmann, W. Rieger, and J. Hilsenbeck. J. Appl. Phys. 85, 3222 (1999).
2. W.-C. Yang, B. J. Rodriguez, R. J. Nemanich, O. Ambacher, and V. Cimalla, J. Appl. Phys. 94, 5720 (2003).
3. D. Li, M. Sumiya, S. Fuke, D. Yang, D. Que, Y. Suzuki, and Y. Fukuda, J. Appl. Phys. 90, 4219 (2001).
4. H. W. Jang, J.-H. Lee, and J.-L. Lee, Appl. Phys. Lett. 80, 3955 (2002).
5. C. I. Wu, A. Kahn, N. Taskar, D. Dorman, and D. Gallagher, J. Appl. Phys. 83, 4249 (1998).
6. K. M. Tracy, W. J. Mecouch, R. F. Davis, and R. J. Nemanich, J. Appl. Phys. 94, 3163 (2003).
7. V. M. Polyakov, F. S. Tautz, S. Sloboshanin, J. A. Schaefer, A. S. Usikov, and B. J. Ber, Semicond. Sci. Technol. 13, 1396 (1998).
8. R. Gutt, P. Lorenz, K. Tonisch, M. Himmerlich, J. A. Schaefer, and S. Krischok. Phys. Status Solidi RRL 2, 212 (2008).
9. S. Choi, T.-H. Kim, P. Wu, A. Brown, H. O. Everitt, M. Losurdo, and G. Bruno, J. Vac. Sci. Technol. B 27, 107 (2009).
10. M. A. Garcia, S. D. Wolter, T.-H. Kim, S. Choi, J. Baier, A. Brown, M. Losurdo, and G. Bruno, Appl. Phys. Lett. 88, 013506 (2006).
11. H. W. Jang, K. W. Ihm, T.-H. Kang, J.-H. Lee, and J.-L. Lee. Phys. Status Solidi B 240, 451 (2003).
12. S. Chevtchenko, X. Ni, Q. Fan, A. A. Baski, and H. Morkoç. Appl. Phys. Lett. 88, 122104 (2006).
13. S.-J. Cho, S. Dogan, S. Sabuktagin, M. A. Reshchikov, D. K. Johnstone, and H. Morkoç. Appl. Phys. Lett. 84, 3070 (2004).
14. C. Hamsen, P. Lorenz, J. A. Schaefer, and S. Krischok. Phys. Status Solidi C 7, 268 (2010).
15. M. Himmerlich, S. Krischok, V. Lebedev, O. Ambacher, and J. A. Schaefer, J. Cryst. Growth 306, 6 (2007).
16. F. S. Tautz, S. Sloboshanin, U. Starke, and J. A. Schaefer, J. Phys.: Condens. Matter 11, 8035 (1999).
17. M. Rakel, C. Cobet, N. Esser, F. Fuchs, F. Bechstedt, R. Goldhahn, W. G. Schmidt, and W. Schaff, Phys. Rev. B 77, 115120 (2008).
18. V. M. Bermudez, J. Appl. Phys. 80, 1190 (1996).
19. S. M. Widstrand, K. O. Magnusson, L. S. O. Johansson, and M. Oshima, Surf. Sci. 584, 169 (2005).
20. P. Lorenz, R. Gutt, M. Himmerlich, J. A. Schaefer, and S. Krischok, Phys. Status Solidi C 7, 1875 (2010), DOI 10.1002/pssc.200983546.
21. P. Ryan, Y.-C. Chao, J. Downes, C. McGuinnes, K. E. Smith, A. V. Samapath, and T. D. Moustakas, Surf. Sci. Lett. 467, L827 (2000).
22. B. J. Kowalski, R. J. Iwanowski, J. Sadowski, I. A. Kowalik, J. Kanski, I. Grzegory, and S. Porowski, Surf. Sci. 548, 220 (2004).
23. M. Kočan, A. Rizzi, H. Lüth, S. Keller, and U. K. Mishra, Phys. Status Solidi B 234, 773 (2002).
24. J. Piprek (ed.), Nitride Semiconductor Devices Principles and Simulation (Wiley-VCH, Weinheim, 2007).
25. H. Ibach and D. L. Mills, Electron Energy Loss Spectroscopy and Surface Vibrations (Academic Press, New York, 1982).