Accurate control of the electrode shape for high resolution shearforce regulated SECM

Electrochimica Acta

Volumn 110, Issue , 2013, Pages 16-21

  Etienne, Mathieu ^a   Moulin, Jean Paul ^a   Gourhand, Sébastien ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

Author keywords

Imaging; Insulating sheath; Nanoelectrode; SECM; Shearforce

Indexed keywords

CONSTANT-DISTANCE MODES; ELECTROCHEMICAL MEASUREMENTS; HIGH RESOLUTION; INSULATING SHEATH; NANOELECTRODE; SCANNING ELECTROCHEMICAL MICROSCOPY; SECM; SHEARFORCE;

IMAGING TECHNIQUES; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

POLISHING;

EID: 84888304051     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2013.03.096     Document Type: Article

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