Optimization of the shearforce signal for scanning electrochemical microscopy and application for kinetic analysis

Electrochimica Acta

Volumn 88, Issue , 2013, Pages 877-884

  Etienne, Mathieu ^a   Lhenry, Sébastien ^a   Cornut, Renaud ^b   Lefrou, Christine ^b  

^a Laboratoire de Chimie Physique et Microbiologie pour l'Environnement   (France)

^b CNRS   (France)

Author keywords

Apparent electron transfer kinetic; Apparent geometry; SECM; Shearforce

Indexed keywords

APPROACH CURVE; DISK GEOMETRIES; ELECTRON TRANSFER KINETICS; FEEDBACK MEASUREMENTS; HETEROGENEOUS KINETICS; HYDRODYNAMIC CONTROL; KINETIC ANALYSIS; OPTIMAL FREQUENCY; REPRODUCIBILITIES; SCANNING ELECTROCHEMICAL MICROSCOPY; SECM; SHEARFORCE; SIMPLE MODIFICATIONS; SIMPLE PROTOCOL;

EXPERIMENTS; KINETICS; NATURAL FREQUENCIES; OPTIMIZATION; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

ANALYTIC EQUIPMENT;

EID: 84871370805     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2012.09.063     Document Type: Article

References (45)

1. A.J. Bard, and M.V. Mirkin Scanning Electrochemical Microscopy 2001 Marcel Dekker Inc. New York
2. G. Wittstock, M. Burchardt, S.E. Pust, Y. Shen, and C. Zhao Scanning electrochemical microscopy for direct imaging of reaction rates Angewandte Chemie International Edition 46 2007 1584
3. P. Sun, F.O. Laforge, and M.V. Mirkin Scanning electrochemical microscopy in the 21st century Physical Chemistry Chemical Physics 9 2007 802
4. S.E. Pust, W. Maier, and G. Wittstock Investigation of localized catalytic and electrocatalytic processes and corrosion reactions with scanning electrochemical microscopy (SECM) Zeitschrift für Physikalische Chemie 222 2008 1463
5. I. Beaulieu, S. Kuss, J. Mauzeroll, and M. Geissler Biological Scanning electrochemical microscopy and its application to live cell studies Analytical Chemistry 83 2011 1485
6. M. Etienne, A. Schulte, and W. Schuhmann High resolution constant-distance mode alternating current scanning electrochemical microscopy (AC-SECM) Electrochemistry Communications 6 2004 288
7. K. Borgwarth, D.G. Ebling, and J. Heinze Applications of scanning ultramicroelectrodes for studies on surface conductivity Electrochimica Acta 40 1995 1455
8. M. Ludwig, C. Kranz, W. Schuhmann, and H.E. Gaub Topography feedback mechanism for the scanning electrochemical microscope based on hydrodynamic forces between tip and sample Review of Scientific Instruments 66 1995 2857
9. P.I. James, L.F. Garfias-Mesias, P.J. Moyer, and W.H. Smyrl Scanning electrochemical microscopy with simultaneous independent topography Journal of the Electrochemical Society 145 1998 L64
10. A. Hengstenberg, C. Kranz, and W. Schuhmann Facilitated tip-positioning and applications of non-electrode tips in scanning electrochemical microscopy using a shear force based constant-distance mode Chemistry European Journal 6 2000 1547
11. B. Ballesteros Katemann, A. Schulte, and W. Schuhmann Constant-distance mode scanning electrochemical microscopy (SECM)-Part I: Adaptation of a non-optical shear-force-based positioning mode for SECM tips Chemistry European Journal 9 2003 2025
12. Y. Lee, Z. Ding, and A.J. Bard Combined scanning electrochemical/optical microscopy with shear force and current feedback Analytical Chemistry 74 2002 3634
13. H. Yamada, H. Fukumoto, T. Yokoyama, and T. Koike Immobilized diaphorase surfaces observed by scanning electrochemical microscope with shear force based tip-substrate positioning Analytical Chemistry 77 2005 1785
14. Y. Takahashi, H. Shiku, T. Murata, T. Yasukawa, and T. Matsue Transfected single-cell imaging by scanning electrochemical optical microscopy with shear force feedback regulation Analytical Chemistry 81 2009 9674
15. C. Cougnon, K. Bauer-Espindola, D.S. Fabre, and J. Mauzeroll Development of a phase-controlled constant-distance scanning electrochemical microscope Analytical Chemistry 81 2009 3654
16. M. Etienne, B. Layoussifi, T. Giornelli, and D. Jacquet SECM-based automate equipped with a shearforce detection for the characterization of large and complex samples Electrochemistry Communications 15 2012 70
17. U.M. Tefashe, and G. Wittstock Quantitative characterization of shear force regulation for scanning electrochemical microscopy Comptes Rendus Chimie 2012 10.1016/j.crci.2012.03.011
18. J.V. Macpherson, and P.R. Unwin Combined scanning electrochemical-atomic force microscopy Analytical Chemistry 72 2000 276
19. C. Kranz, G. Friedbacher, B. Mizaikoff, A. Lugstein, J. Smoliner, and E. Bertagnolli Integrating an ultramicroelectrode in an AFM cantilever: combined technology for enhanced information Analytical Chemistry 73 2001 2491
20. M. Salomo, S.E. Pust, G. Wittstock, and E. Oesterschulze Integrated cantilever probes for SECM/AFM characterization of surfaces Microelectronic Engineering 87 2010 1537
21. K. Leonhardt, A. Avdic, A. Lugstein, I. Pobelov, T. Wandlowski, M. Wu, B. Gollas, and G. Denuault Atomic force microscopy-scanning electrochemical microscopy: influence of tip geometry and insulation defects on diffusion controlled currents at conical electrodes Analytical Chemistry 83 2011 2971
22. R.D. Rodriguez, A. Anne, E. Cambril, and C. Demaille Optimized hand fabricated AFM probes for simultaneous topographical and electrochemical tapping mode imaging Ultramicroscopy 111 2011 973
23. M.R. Gullo, P.L.T.M. Frederix, T. Akiyama, A. Engel, F. Nico, and U. Staufer Characterization of microfabricated probes for combined atomic force and high-resolution scanning electrochemical microscopy Analytical Chemistry 78 2006 5436
24. T.H. Treutler, and G. Wittstock Combination of an electrochemical tunneling microscope (ECSTM) and a scanning electrochemical microscope (SECM): application for tip-induced modification of self-assembled monolayers Electrochimica Acta 48 2003 2923
25. Y. Takahashi, A.I. Shevchuk, P. Novak, Y. Zhang, N. Ebejer, J.V. Macpherson, P.R. Unwin, A.J. Pollard, D. Roy, C.A. Clifford, H. Shiku, T. Matsue, D. Klenerman, and Y.E. Korchev Korchev, Multifunctional nanoprobes for nanoscale chemical imaging and localized chemical delivery at surfaces and interfaces Angewandte Chemie International Edition 50 2011 9638
26. M.A. Alpuche-Aviles, and D.O. Wipf Impedance feedback control for scanning electrochemical microscopy Analytical Chemistry 73 2001 4873
27. B. Ballesteros Katemann, A. Schulte, E.J. Calvo, M. Koudelka-hep, and W. Schuhmann Localised electrochemical impedance spectroscopy with high lateral resolution by means of alternating current scanning electrochemical microscopy Electrochemistry Communications 4 2002 134
28. P.M. Diakowski, and Z. Ding Novel strategy for constant-distance imaging using alternating current scanning electrochemical microscopy Electrochemistry Communications 9 2007 2617
29. M. Pähler, W. Schuhmann, and M. Gratzl Simultaneous visualization of surface topography and concentration field by means of scanning electrochemical microscopy using a single electrochemical probe and impedance spectroscopy ChemPhysChem 12 2011 2798
30. K. McKelvey, M.A. Edwards, and P.R. Unwin Intermittent contact-scanning electrochemical microscopy (IC-SECM): a new approach for tip positioning and simultaneous imaging of interfacial topography and activity Analytical Chemistry 82 2010 6334
31. D. Momotenko, F. Cortes-Salazar, A. Lesch, G. Wittstock, and H.H. Girault Microfluidic push-pull probe for scanning electrochemical microscopy Analytical Chemistry 83 2011 5275
32. A. Lesch, D. Momotenko, F. Cortés-Salazar, I. Wirth, U.M. Tefashe, F. Meiners, B. Vaske, H.H. Girault, and G. Wittstock Fabrication of soft gold microelectrode arrays as probes for scanning electrochemical microscopy Journal of Electroanalytical Chemistry 666 2012 52
33. B. Ballesteros Katemann, A. Schulte, and W. Schuhmann Constant-Distance Mode Scanning Electrochemical Microscopy. Part II: High-Resolution SECM Imaging Employing Pt Nanoelectrodes as Miniaturized Scanning Probes Electroanalysis 16 2004 60
34. A. Hengstenberg, A. Blöchl, I.D. Dietzel, and W. Schuhmann Neurotransmitter secretion from individual microscopy Angewandte Chemie International Edition 40 2001 905
35. K. Eckhard, M. Etienne, A. Schulte, and W. Schuhmann Constant-distance mode AC-SECM for the visualisation of corrosion pits Electrochemistry Communications 9 2007 1793
36. R. Brunner, A. Bietsch, O. Hollricher, and O. Marti Distance control in near-field optical microscopy with piezoelectrical shear-force detection suitable for imaging in liquids Review of Scientific Instruments 68 1997 1769
37. O. Hollricher, R. Brunner, and O. Marti Piezoelectrical shear-force distance control in near-field optical microscopy for biological applications Ultramicroscopy 71 1998 143
38. F.O. Laforge, J. Velmurugan, Y. Wang, and M.V. Mirkin Nanoscale imaging of surface topography and reactivity with the scanning electrochemical microscope Analytical Chemistry 81 2009 3143
39. B.B. Katemann, and W. Schuhmann Fabrication and characterization of needle-type Electroanalysis 14 2002 22
40. M.A. Mezour, M. Morin, and J. Mauzeroll Fabrication and characterization of laser pulled platinum microelectrodes with controlled geometry Analytical Chemistry 83 2011 2378
41. K. Fushimi, K. Azumi, and M. Seo Performance of a microelectrode vibrating above an insulator surface Electrochemistry Communications 6 2004 959
42. R. Cornut, A. Bhasin, S. Lhenry, M. Etienne, and C. Lefrou Accurate and simplified consideration of the probe geometrical defaults in scanning electrochemical microscopy: theoretical and experimental investigations Analytical Chemistry 83 2011 9669
43. C. Lefrou A very easy kinetics determination for feedback curves with a microdisk SECM tip and rather rapid substrate reaction Journal of Electroanalytical Chemistry 601 2007 94
44. M. Pellissier, D. Zigah, F. Barrière, and P. Hapiot Optimized preparation and scanning electrochemical microscopy analysis in feedback mode of glucose oxidase layers grafted onto conducting carbon surfaces Langmuir 24 2008 9089
45. R. Cornut, S. Griveau, and C. Lefrou Accuracy study on fitting procedure of kinetics SECM feedback experiments Journal of Electroanalytical Chemistry 650 2010 55