Constant-distance mode scanning potentiometry. High resolution pH measurements in three-dimensions

Electroanalysis

Volumn 19, Issue 2-3, 2007, Pages 318-323

  Etienne, Mathieu ^a,d   Dierkes, Paul ^c   Erichsen, Thomas ^a   Schuhmann, Wolfgang ^a   Fritsch, Ingrid ^b  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b UNIVERSITY OF ARKANSAS   (United States)

^c HEINRICH HEINE UNIVERSITY   (Germany)

^d Laboratoire de Chimie Physique et Microbiologie pour l'Environnement   (France)

Author keywords

Constant distance mode; Microcavity; pH nanoelectrode; pH profile; SECM; Shear force

Indexed keywords

ANALYTIC EQUIPMENT; ELECTRODES; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

CONSTANT-DISTANCE MODES; HIGH RESOLUTION; MODE SCANNING; NANOELECTRODE; PH MEASUREMENTS; PH NANOELECTRODE; PH PROFILE; POTENTIOMETRY; SCANNING ELECTROCHEMICAL MICROSCOPY; SHEAR FORCE;

MICROCAVITIES;

EID: 34547595066     PISSN: 10400397     EISSN: 15214109     Source Type: Journal    
DOI: 10.1002/elan.200603735     Document Type: Conference Paper

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