SECM detection of single boron doped diamond nanodes and nanoelectrode arrays using phase-operated shear force technique

Electrochemistry Communications

Volumn 24, Issue 1, 2012, Pages 123-127

  Dincer, C ^a,c   Laubender, E ^a   Hees, J ^b   Nebel, C E ^b   Urban, G ^a,c   Heinze, J ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

^b FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

^c Laboratory for Sensors   (Germany)

Author keywords

Boron doped diamond; Constant distance mode; Nanoelectrode array; Scanning electrochemical microscopy (SECM); Shear force detection

Indexed keywords

BORON DOPED DIAMOND; CONSTANT-DISTANCE MODE; NANOELECTRODE ARRAY; SCANNING ELECTROCHEMICAL MICROSCOPY; SHEAR FORCE DETECTION;

BIOSENSORS; DIAMONDS; PLATINUM; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

ANALYTIC EQUIPMENT;

EID: 84867525353     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2012.08.005     Document Type: Article

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