Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy

Ultramicroscopy

Volumn 137, Issue , 2014, Pages 12-19

  Martinez, G T ^a   Rosenauer, A ^b   De Backer, A ^a   Verbeeck, J ^a   Van Aert, S ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b UNIVERSITY OF BREMEN   (Germany)

Author keywords

Composition determination; HAADF STEM; Statistical parameter estimation theory; STEM simulations

Indexed keywords

PARAMETER ESTIMATION; TRANSMISSION ELECTRON MICROSCOPY;

ABSOLUTE QUANTIFICATION; ACCURACY AND PRECISION; COMPOSITION DETERMINATION; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; MULTISLICE SIMULATIONS; STATISTICAL PARAMETER ESTIMATIONS; STEM SIMULATIONS;

ATOMS;

ARTICLE; ATOM; CHEMICAL COMPOSITION; CONTROLLED STUDY; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE INTENSIFIER; MATHEMATICAL MODEL; MOLECULAR IMAGING; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION;

EID: 84888113377     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.11.001     Document Type: Article

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