Multislice simulation of high-resolution scanning transmission electron microscopy Z-contrast images of semiconductor heterointerfaces

Scanning

Volumn 18, Issue 4, 1996, Pages 291-300

  Bollig, B ^a   Fischer, H G ^a   Kubalek, E ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

ADF imaging; Composition dependence; Interface structure; Stacking dependence; ZnSSe ZnSe

Indexed keywords

ARTICLE; CHEMICAL COMPOSITION; CONTRAST ENHANCEMENT; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030317610     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.1996.4950180405     Document Type: Article

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