Performance and reliability of Gd2O3 and stacked Gd2O3-Eu2O3 metal-insulator-metal capacitors

IEEE Transactions on Electron Devices

Volumn 60, Issue 5, 2013, Pages 1523-1528

  Padmanabhan, Revathy ^a   Bhat, Navakanta ^a   Mohan, Sangeneni ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Constant current stress (CCS); Constant voltage stress (CVS); Eu 2O3; Gd2 O3; Metal insulator metal (MIM); Reliability; Voltage coefficient of capacitance (VCC)

Indexed keywords

CONSTANT CURRENT STRESS; CONSTANT VOLTAGE STRESS; ELECTRODE POLARIZATIONS; METAL INSULATOR METAL CAPACITOR (MIM); METAL INSULATOR METALS; PERFORMANCE AND RELIABILITIES; POOLE-FRENKEL CONDUCTION MECHANISM; VOLTAGE COEFFICIENT OF CAPACITANCES;

CAPACITANCE; CAPACITORS; METAL INSULATOR BOUNDARIES; RELIABILITY;

MIM DEVICES;

EID: 84887126654     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2013.2249854     Document Type: Article

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