On low-capture-power test generation for scan testing

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2005, Pages 265-270

  Wen, Xiaoqing ^a   Yamashita, Yoshiyuki ^a   Kajihara, Seiji ^a   Wang, Laung Terng ^b   Saluja, Kewal K ^c   Kinoshita, Kozo ^d  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^b SYNTEST TECHNOLOGIES INC   (United States)

^c University of Wisconsin Madison   (United States)

^d OSAKA GAKUIN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPTURE MODE; FAULT COVERAGES; SCAN TESTING; SWITCHING ACTIVITIES; TEST GENERATIONS; TEST RESPONSE; X-FILLING; YIELD LOSS;

ELECTRICAL ENGINEERING;

INTEGRATED CIRCUIT TESTING;

EID: 84886485321     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2005.60     Document Type: Conference Paper

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