Test data compression using don't-care identification and statistical encoding [logic testing]

Proceedings of the Asian Test Symposium

Volumn 2002-January, Issue , 2002, Pages 67-72

  Kajihara, S ^a   Taniguchi, K ^a   Miyase, K ^a   Pomeranz, I ^b   Reddy, S M ^c  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^b Purdue University   (United States)

^c UNIVERSITY OF IOWA   (United States)

Author keywords

Benchmark testing; Circuit faults; Circuit testing; Data compression; Encoding; Logic testing; Microelectronics; Random number generation; System testing; Test data compression

Indexed keywords

ENCODING (SYMBOLS); LOGIC CIRCUITS; MICROELECTRONICS; RANDOM NUMBER GENERATION;

BENCHMARK TESTING; CIRCUIT FAULTS; CIRCUIT TESTING; LOGIC TESTING; SYSTEM TESTING; TEST DATA COMPRESSION;

DATA COMPRESSION;

EID: 2442520323     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2002.1181687     Document Type: Conference Paper

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