Mapping of trap densities and hotspots in pentacene thin-film transistors by frequency-resolved scanning photoresponse microscopy

Advanced Materials

Volumn 25, Issue 40, 2013, Pages 5719-5724

  Westermeier, Christian ^a   Fiebig, Matthias ^a   Nickel, Bert ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

accumulation layers; charge transport; excitons; organic field effect transistors; trap release

Indexed keywords

CHARGE TRANSFER; EXCITONS; ORGANIC FIELD EFFECT TRANSISTORS; THIN FILM TRANSISTORS; THIN FILMS;

ACCUMULATION LAYERS; GATE VOLTAGES; PENTACENE THIN FILM TRANSISTORS; PENTACENE THIN FILMS; PHOTORESPONSES; TRAP DENSITY; TRAP FILLING; TRAP RELEASE;

THIN FILM CIRCUITS;

NAPHTHACENE DERIVATIVE; PENTACENE;

ACCUMULATION LAYERS; ARTICLE; CHARGE TRANSPORT; CHEMISTRY; EXCITONS; LASER; MICROSCOPY; ORGANIC FIELD-EFFECT TRANSISTORS; SEMICONDUCTOR; TRAP RELEASE;

ACCUMULATION LAYERS; CHARGE TRANSPORT; EXCITONS; ORGANIC FIELD-EFFECT TRANSISTORS; TRAP RELEASE;

LASERS; MICROSCOPY; NAPHTHACENES; TRANSISTORS, ELECTRONIC;

EID: 84886438677     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201300958     Document Type: Article

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