Deep-level defect characteristics in pentacene organic thin films

Applied Physics Letters

Volumn 80, Issue 9, 2002, Pages 1595-1597

  Yang, Yong Suk ^a   Kim, Seong Hyun ^a   Lee, Jeong Ik ^a   Chu, Hye Yong ^a   Do, Lee Mi ^a   Lee, Hyoyoung ^a   Oh, Jiyoung ^a   Zyung, Taehyoung ^a   Ryu, Min Ki ^b   Jang, Min Su ^b  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^b Pusan National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE PROPERTIES; CAPACITANCE VOLTAGE; DEEP-LEVEL DEFECTS; ELECTRONIC CHARGES; ELECTRONIC MATERIALS; INTERFACE TRAPS; ORGANIC THIN FILM TRANSISTORS; ORGANIC THIN FILMS; PENTACENE FILM; PENTACENE THIN FILMS; PENTACENES; SEMICONDUCTOR STRUCTURE;

CAPACITANCE; DEEP LEVEL TRANSIENT SPECTROSCOPY; POWER QUALITY; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM TRANSISTORS; THIN FILMS;

INTERFACES (MATERIALS);

EID: 79956009334     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1459117     Document Type: Article

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