Influence of impurities and structural properties on the device stability of pentacene thin film transistors

Journal of Applied Physics

Volumn 101, Issue 4, 2007, Pages

  Knipp, D ^a   Benor, A ^a   Wagner, V ^a   Muck, T ^a  

^a JACOBS UNIVERSITY BREMEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMPURITIES; MOISTURE; MOLECULAR BEAMS; OXYGEN; POLYCRYSTALLINE MATERIALS; TRANSPORT PROPERTIES;

DEVICE STABILITY; DRY OXYGEN; ORGANIC MOLECULAR BEAM DEPOSITION; PENTACENE THIN FILM TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 33847685634     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2432369     Document Type: Article

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