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Volumn 99, Issue 17, 2011, Pages

Effect of deep traps on small molecule based thin film transistors

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE; DEEP TRAPS; ELECTRICAL CHARACTERISTIC; ORGANIC THIN FILM TRANSISTORS; SMALL MOLECULES; SPECTROSCOPIC METHOD; STRUCTURAL DISORDERS; THREE-TERMINAL DEVICES;

EID: 80555139869     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3656245     Document Type: Article
Times cited : (17)

References (18)
  • 1
  • 4
    • 39349084848 scopus 로고    scopus 로고
    • Bias stress instability in pentacene thin film transistors: Contact resistance change and channel threshold voltage shift
    • DOI 10.1063/1.2844857
    • S. D. Wang, T. Minari, T. Miyadera, Y. Aoyagi, and K. Tsukagoshi, Appl. Phys. Lett. 92, 063305, (2008). 10.1063/1.2844857 (Pubitemid 351263870)
    • (2008) Applied Physics Letters , vol.92 , Issue.6 , pp. 063305
    • Wang, S.D.1    Minari, T.2    Miyadera, T.3    Aoyagi, Y.4    Tsukagoshi, K.5
  • 6
    • 70350339679 scopus 로고    scopus 로고
    • 10.1002/adma.200901136
    • H. Sirringhous, Adv. Mater. 21, 3859 (2009). 10.1002/adma.200901136
    • (2009) Adv. Mater. , vol.21 , pp. 3859
    • Sirringhous, H.1
  • 14
    • 79956011774 scopus 로고    scopus 로고
    • Schottky energy barrier and charge injection in metal/copper- phthalocyanine/metal structures
    • DOI 10.1063/1.1483388
    • K. Mahapatro and S. Ghosh, Appl. Phys. Lett. 80, 4840 (2002). 10.1063/1.1483388 (Pubitemid 34783186)
    • (2002) Applied Physics Letters , vol.80 , Issue.25 , pp. 4840
    • Mahapatro, A.K.1    Ghosh, S.2
  • 18
    • 77954832856 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.81.035327
    • W. L. Kalb and B. Batlogg, Phys. Rev. B 81, 035327 (2010). 10.1103/PhysRevB.81.035327
    • (2010) Phys. Rev. B , vol.81 , pp. 035327
    • Kalb, W.L.1    Batlogg, B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.