SCOPUS 정보 검색 플랫폼

Volumn 617, Issue , 2013, Pages 113-117

Competing scanning tunneling microscope tip-interlayer interactions for twisted multilayer graphene on the a-plane SiC surface

(10) Xu, P a Ackerman, M L a Barber, S D a Schoelz, J K a Thibado, P M a Wheeler, V D b Nyakiti, L O b Myers Ward, R L b Eddy, C R b Gaskill, D K b

a UNIVERSITY OF ARKANSAS (United States)

b NAVAL RESEARCH LABORATORY (United States)

Author keywords

Moir pattern; Scanning tunneling microscopy; Silicon carbide; Twisted grapheme

Indexed keywords

BOND LENGTH; GRAPHENE; MULTILAYERS; SCANNING TUNNELING MICROSCOPY;

A-PLANE; DYNAMIC BEHAVIORS; EPITAXIAL GRAPHENE; INTERLAYER INTERACTIONS; MICROSCOPY IMAGES; MOIRÉ PATTERN; MULTILAYER GRAPHENE; SCANNING TUNNELLING MICROSCOPES; SYNTHESISED; TWISTED GRAPHEME;

SILICON CARBIDE;

EID: 84883751175 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2013.06.012 Document Type: Article

Times cited : (6)

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