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Volumn 20, Issue 35, 2009, Pages

Atomic-scale imaging and manipulation of ridges on epitaxial graphene on 6H-SiC(0001)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE IMAGING; ATOMIC-RESOLUTION IMAGING; COMPRESSIVE STRAIN; EPITAXIAL GRAPHENE; GRAPHENE LAYERS; GRAPHENES; LOWER LIMITS; SCANNING TUNNELING MICROSCOPY (STM); TIP-SURFACE INTERACTION;

EID: 70349097285     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/35/355701     Document Type: Article
Times cited : (92)

References (21)
  • 17


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.