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Volumn 20, Issue 35, 2009, Pages
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Atomic-scale imaging and manipulation of ridges on epitaxial graphene on 6H-SiC(0001)
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC SCALE IMAGING;
ATOMIC-RESOLUTION IMAGING;
COMPRESSIVE STRAIN;
EPITAXIAL GRAPHENE;
GRAPHENE LAYERS;
GRAPHENES;
LOWER LIMITS;
SCANNING TUNNELING MICROSCOPY (STM);
TIP-SURFACE INTERACTION;
GRAPHITE;
SCANNING TUNNELING MICROSCOPY;
SILICON CARBIDE;
SOIL CONSERVATION;
SEMICONDUCTING SILICON COMPOUNDS;
GRAPHENE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
MORPHOLOGICAL TRAIT;
PRIORITY JOURNAL;
ROOM TEMPERATURE;
SCANNING TUNNELING MICROSCOPY;
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EID: 70349097285
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/20/35/355701 Document Type: Article |
Times cited : (92)
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References (21)
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