Measuring the degree of stacking order in graphite by Raman spectroscopy

Carbon

Volumn 46, Issue 2, 2008, Pages 272-275

  Cancado L G ^a,c   Takai, K ^a   Enoki, T ^a   Endo, M ^b   Kim, Y A ^b   Mizusaki, H ^b   Speziali, N L ^c   Jorio, A ^c   Pimenta, M A ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SHINSHU UNIVERSITY   (Japan)

^c FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; NANOPARTICLES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; X RAY DIFFRACTION;

BAND SCATTERING; GRAPHITIC SYSTEMS; RELATIVE VOLUMES; STACKING ORDERS;

GRAPHITE;

EID: 39149137207     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2007.11.015     Document Type: Article

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