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Volumn 25, Issue 38, 2013, Pages

Direct measurement and modelling of internal strains in ion-implanted diamond

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS CARBON LAYER; FINITE ELEMENT SIMULATIONS; HIGH RESOLUTION X RAY DIFFRACTION; PHENOMENOLOGICAL MODELING; SATURATION EFFECTS; SIMULTANEOUS IMPLANTATION; SINGLE CRYSTAL DIAMOND; TRANSMISSION ELECTRON;

EID: 84883565150     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/25/38/385403     Document Type: Article
Times cited : (32)

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