메뉴 건너뛰기




Volumn 14, Issue , 2012, Pages

Fabrication and electrical characterization of three-dimensional graphitic microchannels in single crystal diamond

Author keywords

[No Author keywords available]

Indexed keywords

BURIED CHANNELS; CRITICAL DAMAGE; CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; DIAMOND BASED DEVICES; DIRECT WRITING; ELECTRICAL CHARACTERIZATION; END-OF-RANGE; GRAPHITIC PHASE; HELIUM ION; HIGH ENERGY; HIGH-TEMPERATURE ANNEALING; INSULATING MATRIX; ION FLUENCES; ION MICROBEAMS; ROOM TEMPERATURE; SAMPLE SURFACE; SIGNIFICANT IMPACTS; SINGLE CRYSTAL DIAMOND; SPATIAL ACCURACY; SPATIAL DIRECTION; SPECIFIC LOCATION; STRUCTURAL DAMAGES; THERMAL PROCESS; THERMAL-ANNEALING; VARIABLE TEMPERATURE;

EID: 84862112318     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/14/5/053011     Document Type: Article
Times cited : (52)

References (54)
  • 2
    • 0037031719 scopus 로고    scopus 로고
    • Isberg J et al 2002 Science 297 1670
    • (2002) Science , vol.297 , pp. 1670
    • Isberg, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.