Estimation of unknown structure parameters from high-resolution (S)TEM images: What are the limits?

Ultramicroscopy

Volumn 134, Issue , 2013, Pages 34-43

  Den Dekker, A J ^a   Gonnissen, J ^b   De Backer, A ^b   Sijbers, J ^b   Van Aert, S ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Data processing image processing; Electron microscope design and characterization; High resolution transmission electron microscopy (HRTEM)

Indexed keywords

CONTINUOUS PARAMETERS; ELECTRON MICROSCOPY IMAGES; HIGH-ANGLE ANNULAR DARK FIELDS; QUANTITATIVE METHOD; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STATISTICAL MODELING; STATISTICAL PARAMETER ESTIMATIONS; STRUCTURE PARAMETER;

ALGORITHMS; ATOMS; DATA HANDLING; ESTIMATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

PARAMETER ESTIMATION;

ACCURACY; ALGORITHM; ARTICLE; CRAMER RAO LOWER BOUND; DETECTION THEORY; ELECTRON MICROSCOPY; EXPERIMENTAL DESIGN; HIGH ANGLE ANNULAR DARK FIELD TRANSMISSION ELECTRON MICROSCOPY; MAXIMUM LIKELIHOOD METHOD; NULL HYPOTHESIS; SIMULATION; SINGLE ATOM TRANSMISSION ELECTRON MICROSCOPY; STATISTICAL CONCEPTS; STATISTICAL MODEL; STATISTICAL PARAMETERS; THEORETICAL MODEL; TRANSMISSION ELECTRON MICROSCOPY;

DATA PROCESSING/IMAGE PROCESSING; ELECTRON MICROSCOPE DESIGN AND CHARACTERIZATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);

ALGORITHMS; ELECTRON MICROSCOPE TOMOGRAPHY; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; MODELS, STATISTICAL;

EID: 84883561058     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.05.017     Document Type: Article

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