Precision of three-dimensional atomic scale measurements from HRTEM images: What are the limits?

Ultramicroscopy

Volumn 114, Issue , 2012, Pages 20-30

  Wang, A ^a   Van Aert, S ^a   Goos, P ^a,b   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b ERASMUS UNIVERSITY ROTTERDAM   (Netherlands)

Author keywords

Bayesian experimental design; Data processing; High resolution transmission electron microscopy; Structure determination

Indexed keywords

ATOMIC SCALE; BAYESIAN EXPERIMENTAL DESIGNS; DEFOCUS; ELECTRON DOSE; HIGH RESOLUTION; HRTEM IMAGES; IMAGE CONTRASTS; INCIDENT ELECTRONS; MICROSCOPE DESIGN; OBJECT PARAMETERS; SINGLE ATOMS; STATISTICAL PRECISION; STRUCTURE DETERMINATION; SURFACE PROFILES; SURFACE STEPS; THREE-DIMENSIONAL STRUCTURE;

ATOMS; DATA PROCESSING; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

THREE DIMENSIONAL;

ABSORPTION; ACCURACY; ARTICLE; ELECTRON; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MASS; MICROSCOPE; PHONON; PHONON SCATTERING; QUANTITATIVE ANALYSIS; SIGNAL NOISE RATIO; SURFACE PROPERTY; THICKNESS; THREE DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84857017273     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.12.002     Document Type: Article

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