Throughput maximization of particle radius measurements through balancing size versus current of the electron probe

Ultramicroscopy

Volumn 111, Issue 7, 2011, Pages 940-947

  Van den Broek, W ^a   Van Aert, S ^a   Goos, P ^a,b   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b ERASMUS UNIVERSITY ROTTERDAM   (Netherlands)

Author keywords

Bayesian experimental design; Electron probe; HAADF STEM; Maximum throughput

Indexed keywords

ATOMIC NUMBERS; BAYESIAN EXPERIMENTAL DESIGNS; DETECTOR GEOMETRY; ELECTRON PROBE; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; MAXIMUM THROUGH-PUT; OPTIMAL PROBE; PARTICLE RADII; PRIOR KNOWLEDGE; PROBE SIZE; STATISTICAL EXPERIMENTAL DESIGN; THROUGHPUT MAXIMIZATION; TIME FRAME;

ATOMS; ELECTRONS; OPTIMIZATION; STATISTICS; THROUGHPUT; TRANSMISSION ELECTRON MICROSCOPY;

PROBES;

ARTICLE; BAYES THEOREM; ELECTRON PROBE MICROANALYSIS; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; HIGH THROUGHPUT SCREENING; IMAGE ANALYSIS; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; MOLECULAR IMAGING; MONTE CARLO METHOD; PARTICLE SIZE; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM; BAYES THEOREM; ELECTRONS; GOLD; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; MODELS, THEORETICAL; MONTE CARLO METHOD; NANOPARTICLES; PARTICLE SIZE; SPECIMEN HANDLING; ZINC;

EID: 80053052444     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.11.025     Document Type: Article

References (24)

1. Kirkland E.J. Advanced Computing in Electron Microscopy 1998, Plenum Press, New York.
2. Intaraprasonk V., Xin H.L., Muller D.A. Ultramicroscopy 2008, 108:1454.
3. Barth J.E., Kruit P. Optik 1996, 101:101.
4. Frieden B.R. Physics from Fisher Information-A Unification 1998, Cambridge University Press, Cambridge.
5. Van Aert S., den Dekker A.J., Van Dyck D., van den Bos A. Ultramicroscopy 2002, 90:273.
6. Van Aert S., Van Dyck D., den Dekker A.J. Optics Express 2006, 14:3830.
7. Van Aert S., den Dekker A.J., Van Dyck D. Micron 2004, 35:425.
8. S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck, Statistical experimental design for quantitative atomic resolution transmission electron microscopy, in: P.W. Hawkes (Ed.), Advances in Imaging and Electron Physics, Academic Press, San Diego, vol. 130, pp. 1-164.
9. den Dekker A.J., Van Aert S., Van Dyck D., van den Bos A., Geuens P. Ultramicroscopy 2001, 89:275.
10. Atkinson A.C., Donev A.N. Optimum Experimental Designs 1992, Clarendon Press, Oxford.
11. Barth J.E., Nykerk M.D. Nuclear Instruments and Methods in Physics Research A 1999, 427:86.
12. Kruit P., Bezuijen M., Barth J.E. Journal of Applied Physics 2006, 99:024315-1.
13. Van Aert S., Van Dyck D. Philosophical Magazine B 2001, 81:1833.
14. Hartel P., Rose H., Dinges C. Ultramicroscopy 1996, 63:93.
15. den Dekker A.J., Sijbers J., Van Dyck D. Journal of Microscopy 1999, 194:95.
16. Bettens E., Van Dyck D., den Dekker A.J., Sijbers J., van den Bos A. Ultramicroscopy 1999, 77:37.
17. den Dekker A.J., Van Aert S., van den Bos A., Van Dyck D. Ultramicroscopy 2005, 104:83.
18. M.G. Kendall, A. Stuart, The Advanced Theory of Statistics-Inference and Relationship, second ed., vol. 2, Charles Griffin and Company Limited, London, 1967.
19. Dror H.A., Steinberg D.M. Technometrics 2006, 48(4):520.
20. Yu J., Goos P., Vandebroek M. Transportation Research Part B: Methodological 2010, 44(10):1268.
21. Brown W.K., Wohletz K.H. Journal of Applied Physics 1995, 78(4):2758.
22. Kodas T.T., Hampden-Smith M.J. Aerosol Processing of Materials 1999, Wiley-VCH, New York.
23. Dror H.A., Steinberg D.M. Journal of American Statistical Association 2008, 103:288.
24. Gradshteyn I.S., Ryzhik I.M. Table of Integrals, Series, and Products 2007, Elsevier Academic Press.