New metrics for the reliability of approximate and probabilistic adders

IEEE Transactions on Computers

Volumn 62, Issue 9, 2013, Pages 1760-1771

  Liang, Jinghang ^a   Han, Jie ^a   Lombardi, Fabrizio ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b Northeastern University   (United States)

Author keywords

Adders; Approximate logic; Energy efficiency; Error masking; Imprecise arithmetic; Inexact computing; Mean error distance; Normalized error distance; Power; Reliability

Indexed keywords

APPROXIMATE LOGIC; ERROR MASKING; IMPRECISE ARITHMETICS; INEXACT COMPUTING; MEAN ERROR DISTANCES; NORMALIZED ERRORS; POWER;

DESIGN; ENERGY EFFICIENCY; RELIABILITY;

ADDERS;

EID: 84881130721     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2012.146     Document Type: Article

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