-
1
-
-
33847351187
-
Fabrication of a millinewton force sensor using low temperature co-fired ceramic (LTCC) technology
-
DOI 10.1016/j.sna.2006.05.025, PII S0924424706003785
-
H. Birol, T. Maeder, I. Nadzeyka, M. Boers, and P. Ryser Fabrication of a millinewton force sensor using low temperature co-fired ceramic (LTCC) technology Sensors and Actuators A 134 2007 334 338 (Pubitemid 46349555)
-
(2007)
Sensors and Actuators, A: Physical
, vol.134
, Issue.2
, pp. 334-338
-
-
Birol, H.1
Maeder, T.2
Nadzeyka, I.3
Boers, M.4
Ryser, P.5
-
3
-
-
78650264650
-
Integrated LTCC pressure/flow/temperature multisensor for compressed air diagnostics
-
Y. Fournier, T. Maeder, G. Boutinard-Rouelle, A. Barras, N. Craquelin, and P. Ryser Integrated LTCC pressure/flow/temperature multisensor for compressed air diagnostics Sensors 10 12 2010 11156 11173
-
(2010)
Sensors
, vol.10
, Issue.12
, pp. 11156-11173
-
-
Fournier, Y.1
Maeder, T.2
Boutinard-Rouelle, G.3
Barras, A.4
Craquelin, N.5
Ryser, P.6
-
4
-
-
58149485447
-
Feasibility study of a thick-film PZT resonant pressure sensor made on a prefired 3D LTCC structure
-
M.S. Zarnik, D. Belavic, S. Maček, and J. Holc Feasibility study of a thick-film PZT resonant pressure sensor made on a prefired 3D LTCC structure International Journal of Applied Ceramic Technology 6 1 2009 9 17
-
(2009)
International Journal of Applied Ceramic Technology
, vol.6
, Issue.1
, pp. 9-17
-
-
Zarnik, M.S.1
Belavic, D.2
Maček, S.3
Holc, J.4
-
5
-
-
77955117316
-
An LTCC-based capacitive pressure sensor with a digital output
-
M.S. Zarnik, D. Belavic, and S. Maček An LTCC-based capacitive pressure sensor with a digital output Informacije MIDEM 40 1 2010 74 81
-
(2010)
Informacije MIDEM
, vol.40
, Issue.1
, pp. 74-81
-
-
Zarnik, M.S.1
Belavic, D.2
Maček, S.3
-
6
-
-
77949340360
-
The warm-up and offset stability of a low-pressure piezoresistive ceramic pressure sensor
-
M.S. Zarnik, D. Belavic, and S. Maček The warm-up and offset stability of a low-pressure piezoresistive ceramic pressure sensor Sensors and Actuators A 158 2 2010 198 206
-
(2010)
Sensors and Actuators A
, vol.158
, Issue.2
, pp. 198-206
-
-
Zarnik, M.S.1
Belavic, D.2
Maček, S.3
-
7
-
-
84864917226
-
An experimental numerical study of the humidity effect on the stability of a capacitive ceramic pressure sensor
-
M.S. Zarnik, and D. Belavic An experimental numerical study of the humidity effect on the stability of a capacitive ceramic pressure sensor Radioengineering 21 1 2012 201 2016
-
(2012)
Radioengineering
, vol.21
, Issue.1
, pp. 201-2016
-
-
Zarnik, M.S.1
Belavic, D.2
-
8
-
-
84858673544
-
The effect of humidity on the stability of LTCC pressure sensors
-
M.S. Zarnik, and D. Belavic The effect of humidity on the stability of LTCC pressure sensors Metrology and Measurement Systems 19 1 2012 133 140
-
(2012)
Metrology and Measurement Systems
, vol.19
, Issue.1
, pp. 133-140
-
-
Zarnik, M.S.1
Belavic, D.2
-
9
-
-
0029369502
-
Influences of humidity and moisture on the long-term stability of piezoresistive pressure sensors
-
A. Nakladal, K. Sager, and G. Gerlach Influences of humidity and moisture on the long-term stability of piezoresistive pressure sensors Measurement 16 1995 21 29
-
(1995)
Measurement
, vol.16
, pp. 21-29
-
-
Nakladal, A.1
Sager, K.2
Gerlach, G.3
-
10
-
-
84877783723
-
Stability of a piezoresistive ceramic pressure sensor made with LTCC technology
-
Erfurt, Germany
-
M.S. Zarnik, and D. Belavic Stability of a piezoresistive ceramic pressure sensor made with LTCC technology Proceedings of IMAPS/ACerS Conference, CICMT 2012 Erfurt, Germany 2012
-
(2012)
Proceedings of IMAPS/ACerS Conference, CICMT 2012
-
-
Zarnik, M.S.1
Belavic, D.2
-
11
-
-
84869173831
-
Evaluation of piezoresistive ceramic pressure sensors using noise measurements
-
V. Sedlakova, J. Majzner, P. Sedlak, M. Kopecky, J. Sikula, M.S. Zarnik, D. Belavic, and M. Hrovat Evaluation of piezoresistive ceramic pressure sensors using noise measurements Informacije MIDEM 42 2 2012 109 114
-
(2012)
Informacije MIDEM
, vol.42
, Issue.2
, pp. 109-114
-
-
Sedlakova, V.1
Majzner, J.2
Sedlak, P.3
Kopecky, M.4
Sikula, J.5
Zarnik, M.S.6
Belavic, D.7
Hrovat, M.8
-
12
-
-
84880320986
-
Low frequency noise measurements as a tool for indication of the stability of thick-film piezoresistive ceramic pressure sensors
-
Poland
-
M.S. Zarnik, D. Belavic, M. Hrovat, V. Sedlakova, J. Sikula, P. Sedlak, and J. Majzner Low frequency noise measurements as a tool for indication of the stability of thick-film piezoresistive ceramic pressure sensors Proceedings of International Conference on IMAPS-CPMT Poland 2012
-
(2012)
Proceedings of International Conference on IMAPS-CPMT
-
-
Zarnik, M.S.1
Belavic, D.2
Hrovat, M.3
Sedlakova, V.4
Sikula, J.5
Sedlak, P.6
Majzner, J.7
-
13
-
-
36349005883
-
Yield enhancement of piezoresistive pressure sensors for automotive applications
-
DOI 10.1016/j.sna.2007.07.017, PII S0924424707005584
-
M. Pavlin, and F. Novak Yield enhancement of piezoresistive pressure sensors for automotive applications Sensors and Actuators A 141 1 2008 34 42 (Pubitemid 350151724)
-
(2008)
Sensors and Actuators, A: Physical
, vol.141
, Issue.1
, pp. 34-42
-
-
Pavlin, M.1
Novak, F.2
-
14
-
-
4344629107
-
Long term stability estimation of DC electrical sources from low frequency noise measurements
-
Maspalomas, Spain
-
G. Giusi, G. Scandurra, C. Ciofi, and C. Pace Long term stability estimation of DC electrical sources from low frequency noise measurements Proceedings of Conference on Noise Devices Circuits Maspalomas, Spain 2004 470 479
-
(2004)
Proceedings of Conference on Noise Devices Circuits
, pp. 470-479
-
-
Giusi, G.1
Scandurra, G.2
Ciofi, C.3
Pace, C.4
-
16
-
-
4444333675
-
Noise and non-linearity as reliability indicators of electronic devices
-
J. Sikula, V. Sedlakova, and P. Dobis Noise and non-linearity as reliability indicators of electronic devices Informacije MIDEM 2004 213 222
-
(2004)
Informacije MIDEM
, pp. 213-222
-
-
Sikula, J.1
Sedlakova, V.2
Dobis, P.3
-
17
-
-
84876963327
-
Reliability of electronic devices: Failure mechanisms and testing
-
J. Sikula, V. Sedlakova, M. Tacano, and T. Zednicek Reliability of electronic devices: failure mechanisms and testing Reliability, Risk and Safety: Theory and Applications 1-3 2010 1925 1936
-
(2010)
Reliability, Risk and Safety: Theory and Applications
, vol.1-3
, pp. 1925-1936
-
-
Sikula, J.1
Sedlakova, V.2
Tacano, M.3
Zednicek, T.4
-
18
-
-
0016994076
-
On the calculation of 1/f noise of contacts
-
L.K.J. Vandamme On the calculation of 1/f noise of contacts Applied Physics 11 1976 89 96
-
(1976)
Applied Physics
, vol.11
, pp. 89-96
-
-
Vandamme, L.K.J.1
-
19
-
-
0012278046
-
Noise in solid state microstructures: A new perspective on individual defects, interface states and low frequency (1/f) noise
-
M.J. Kirton, and M.J. Uren Noise in solid state microstructures: a new perspective on individual defects, interface states and low frequency (1/f) noise Advances in Physics 38 1989 367
-
(1989)
Advances in Physics
, vol.38
, pp. 367
-
-
Kirton, M.J.1
Uren, M.J.2
-
20
-
-
0005250916
-
On 1/f noise and random telegraph noise in very small electronic devices
-
T.G.M. Kleinpenning On 1/f noise and random telegraph noise in very small electronic devices Physica B164 1990 331
-
(1990)
Physica
, vol.164 B
, pp. 331
-
-
Kleinpenning, T.G.M.1
-
21
-
-
45849087029
-
Some physical properties of vinylpyridine carbon-black composites
-
L.I. Soliman, and W.M. Sayed Some physical properties of vinylpyridine carbon-black composites Egyptian Journal of Solids 25 1 2002 103 113
-
(2002)
Egyptian Journal of Solids
, vol.25
, Issue.1
, pp. 103-113
-
-
Soliman, L.I.1
Sayed, W.M.2
-
23
-
-
0035310720
-
Low frequency noise of thick-film resistors as quality and reliability indicator
-
D. Rocak, D. Belavic, M. Hrovat, J. Sikula, P. Koktavy, J. Pavelka, and V. Sedlakova Low frequency noise of thick-film resistors as quality and reliability indicator Microelectronics Reliability 41 4 2002 531 542
-
(2002)
Microelectronics Reliability
, vol.41
, Issue.4
, pp. 531-542
-
-
Rocak, D.1
Belavic, D.2
Hrovat, M.3
Sikula, J.4
Koktavy, P.5
Pavelka, J.6
Sedlakova, V.7
-
24
-
-
77956987431
-
Electrical noise as a measure of reliability in electronic devices
-
B.K. Jones Electrical noise as a measure of reliability in electronic devices Advances in Electronics and Electron Physics 67 1994 201 257
-
(1994)
Advances in Electronics and Electron Physics
, vol.67
, pp. 201-257
-
-
Jones, B.K.1
-
27
-
-
21544434131
-
Experimental studies on 1/f noise
-
F.N. Hooge Experimental studies on 1/f noise Reports on Progress in Physics 44 5 1981 479 532
-
(1981)
Reports on Progress in Physics
, vol.44
, Issue.5
, pp. 479-532
-
-
Hooge, F.N.1
-
29
-
-
0033339214
-
Thick-film resistor quality indicator based on noise index measurements
-
DOI 10.1016/S0026-2692(99)00050-6
-
M.M. Jevtic Thick-film resistor quality indicator based on noise index measurements Microelectronics Journal 1999 1255 1259 (Pubitemid 30505468)
-
(1999)
Microelectronics Journal
, vol.30
, Issue.12
, pp. 1255-1259
-
-
Jevtic, M.M.1
Mrak, I.2
Stanimirovic, Z.3
-
31
-
-
84880288382
-
Current density distribution, noise and non-linearity of thick film resistors
-
EMPC Friedrichshafen, Germany
-
V. Sedlakova, F. Melkes, J. Sikula, P. Dobis, D. Rocak, D. Belavic, M. Tacano, and S. Hashiguchi Current density distribution, noise and non-linearity of thick film resistors Proceedings of 14th European Microelectronics and Packaging Conference 2003 EMPC Friedrichshafen, Germany 127 132
-
(2003)
Proceedings of 14th European Microelectronics and Packaging Conference
, pp. 127-132
-
-
Sedlakova, V.1
Melkes, F.2
Sikula, J.3
Dobis, P.4
Rocak, D.5
Belavic, D.6
Tacano, M.7
Hashiguchi, S.8
|