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Volumn 141, Issue 1, 2008, Pages 34-42

Yield enhancement of piezoresistive pressure sensors for automotive applications

Author keywords

Calibration; Piezoresistive sensors; Production test; Yield

Indexed keywords

AUTOMOTIVE ENGINEERING; CALIBRATION; DATA REDUCTION; QUALITY MANAGEMENT;

EID: 36349005883     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2007.07.017     Document Type: Article
Times cited : (21)

References (12)
  • 1
    • 21244492003 scopus 로고    scopus 로고
    • New test paradigms for yield and manufacturability
    • Madge R. New test paradigms for yield and manufacturability. IEEE Des. Test Comput. 22 3 (2005) 240-246
    • (2005) IEEE Des. Test Comput. , vol.22 , Issue.3 , pp. 240-246
    • Madge, R.1
  • 2
    • 36348993997 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, http://www.itrs.net/home.html.
  • 8
    • 36348998398 scopus 로고    scopus 로고
    • ZMD31020, Differential Sensor Signal Conditioner Application, Note Rev. 1.3, July 25, 2002.
  • 11
    • 0036443180 scopus 로고    scopus 로고
    • An effective diagnosis method to support yield improvement
    • Baltimore, USA, October 7-10
    • Hora C., et al. An effective diagnosis method to support yield improvement. International Test Conference. Baltimore, USA, October 7-10 (2002) 260-269
    • (2002) International Test Conference , pp. 260-269
    • Hora, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.