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Volumn 112, Issue 12, 2012, Pages

Understanding the resistive switching characteristics and mechanism in active SiOx-based resistive switching memory

Author keywords

[No Author keywords available]

Indexed keywords

COMPLIANCE CONTROL; SILICON COMPOUNDS; TANTALUM COMPOUNDS;

EID: 84879853293     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4769218     Document Type: Article
Times cited : (85)

References (31)
  • 14
    • 84864151731 scopus 로고    scopus 로고
    • 10.1063/1.4730776
    • M. Sasaki, J. Appl. Phys. 112, 014501 (2012). 10.1063/1.4730776
    • (2012) J. Appl. Phys. , vol.112 , pp. 014501
    • Sasaki, M.1
  • 19
    • 43549126477 scopus 로고    scopus 로고
    • 10.1016/S1369-7021(08)70119-6
    • A. Sawa, Mater. Today 11, 28 (2008). 10.1016/S1369-7021(08)70119-6
    • (2008) Mater. Today , vol.11 , pp. 28
    • Sawa, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.