Phase-contrast imaging in aberration-corrected scanning transmission electron microscopy

Micron

Volumn 49, Issue , 2013, Pages 1-14

  Krumeich, F ^a   Muller E ^b   Wepf, R A ^b  

^a LABORATORY OF INORGANIC CHEMISTRY   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

Aberration correction; Bright field; Phase contrast; Reciprocity theorem; STEM

Indexed keywords

ABERRATION CORRECTION; BRIGHT FIELDS; PHASE CONTRASTS; RECIPROCITY THEOREM; STEM;

COMPUTER SOFTWARE; TANTALUM;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 84877111853     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2013.03.006     Document Type: Review

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