Capturing the signature of single atoms with the tiny probe of a STEM

Ultramicroscopy

Volumn 123, Issue , 2012, Pages 80-89

  Colliex, C ^a   Gloter, A ^a   March, K ^a   Mory, C ^a   Stephan O ^a   Suenaga, K ^b   Tence M ^a  

^a UNIVERSITÉ PARIS SUD   (France)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Electron energy loss spectrometry (EELS); Scanning transmission electron microscope (STEM); Single atom identification

Indexed keywords

ELECTRON ENERGY-LOSS SPECTROMETRY; IDENTIFICATION OF INDIVIDUALS; INCIDENT ELECTRON BEAMS; OPTICAL SPECTROMETERS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SINGLE ATOMS; WIDE FIELD;

ATOMIC SPECTROSCOPY; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; LATTICE CONSTANTS; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

ARTICLE; ATOM; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; EQUIPMENT DESIGN; IMAGE ANALYSIS; IMAGE PROCESSING; MOLECULAR DYNAMICS; MOLECULAR IMAGING; MOLECULAR PROBE; OPTICS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTROMETER; X RAY; CHEMICAL BINDING; ELECTRON MICROSCOPE; IMAGE DISPLAY; MICROANALYSIS; MICROSCOPE IMAGE; NANOPROBE; SCANNING TRANSMISSION ELECTRON MICROSCOPE; ELECTRON; EQUIPMENT; METHODOLOGY; REVIEW;

ELECTRONS; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; SPECTROSCOPY, ELECTRON ENERGY-LOSS;

EID: 84870399352     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.04.003     Document Type: Article

References (46)

1. Crewe A.V., Wall J., Langmore J. Visibility of single atoms. Science 1970, 168:1338.
2. Wall J., Langmore J., Isaacson M., Crewe A.V. Scanning transmission electron microscopy at high resolution. Proceedings of the National academy of Sciences of the United States of America 1974, 71:1.
3. Crewe A.V., Isaacson M., Johnson D. A high resolution electron spectrometer for use in transmission scanning electron microscopy. Review of Scientific Instruments 1971, 42:411.
4. Dellby N., Bacon N.J., Hrncirik P., Murfitt M.F., Skone G.S., Szilagyi Z.S., Krivanek O.L. Dedicated STEM for 200 to 40kV operation. European Physical Journal Applied Physics 2011, 54:33505.
5. Sasaki T., Sawada H., Hosokawa F., Kohno Y., Tomita T., Kanayama T., Kondo Y., Kimoto K., Sato Y., Suenaga K. Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun. Journal of Electron Microscopy 2010, 59(Supplement):S7.
6. Haider M., Rose H., Uhlemann S., Schwan E., Kabius B., Urban K. A spherical-aberration-corrected 200kV transmission electron microscope. Ultramicroscopy 1998, 75:53.
7. Haider M., Uhlemann S., Schwan E., Rose H., Kabius B., Urban K. Electron microscopy image enhanced. Nature 1998, 392:768.
8. Krivanek O.L., Dellby N., Lupini A.R. Towards sub-Å electron beams. Ultramicroscopy 1999, 78:1.
9. Krivanek O.L., Nellist P.D., Dellby N., Murfitt M.F., Szilagyi Z. Towards sub-0.5Å electron beams. Ultramicroscopy 2003, 96:229.
10. Krivanek O.L., Corbin G.J., Dellby N., Elston B.F., Keyse R.J., Murfitt M.F., Own C.S., Szilagyi Z.S., Woodruff J.W. An electron microscope for the aberration-corrected era. Ultramicroscopy 2008, 108:179.
11. Krivanek O.L., Dellby N., Murfitt M.F., Chisholm M.F., Penniyook T.J., Suenaga K., Nicolosi V. Gentle STEM: ADF imaging and EELS at low primary energies. Ultramicroscopy 2010, 110:935.
12. Sawada H., Sasaki T., Hosokawa F., Yuasa S., Terao M., Kawazoe M., Nakamichi T., Kaneyama T., Kondo Y., Kimoto K., Suenaga K. Correction of higher-order geometrical aberration by triple 3-fold astigmatism field. Journal of Electron Microscopy 2009, 58:341.
13. Sawada H., Sasaki T., Hosokawa F., Yuasa S., Terao M., Kawazoe M., Nakamichi T., Kaneyama T., Kondo Y., Kimoto K., Suenaga K. Higher-order aberration corrector for an image-forming system in a transmission electron microscope. Ultramicroscopy 2010, 110:958.
14. Kaiser U., Biskupek J., Meyer J.C., Leschner J., Lechner L., Rose H., Stöger-Pollach M., Khlobystov A.N., hartel P., Müller H., Haider M., Eyhusen S., Benner G. Transmission electron microscopy at 20kV for imaging and spectroscopy. Ultramicroscopy 2011, 111:1239.
15. Mory C., Colliex C., Cowley J.M. Optimum defocus for STEM imaging and microanalysis. Ultramicroscopy 1987, 21:171.
16. Reimer L. Transmission Electron Microscopy: Physics of Image Formation and Microanalysis 1993, vol. 36. Springer Series in Optical Sciences, Chapter 5, p. 136. 3rd edn.
17. Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope 1996, Plenum Press, Chapter 3, p. 131. 2nd edn.
18. Colliex C., Mory C., Olins A.L., Olins D.E., Tencé M. Energy filtered STEM imaging of thick biological sections. Journal of Microscopy 1989, 153:1.
19. Krivanek O.L., Chisholm M.F., Nicolosi V., Pennycook T.J., Corbin G.J., Dellby N., Murfitt M.F., Own C.S., Szilagyi Z.S., Oxley M.P., Pantelides S.T., Pennycook S.J. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy. Nature 2010, 464:571.
20. Isaacson M., Johnson D. The microanalysis of light elements using transmitted energy loss electrons. Ultramicroscopy 1975, 1:33.
21. Colliex C., Cosslett V.E., Leapman R.D., Trebbia P. Contribution of electron energy loss spectroscopy to the development of analytical electron microscopy. Ultramicroscopy 1976, 1:301.
22. M. Isaacson, M. Utlaut, 1979, In: Proceedings of the 37th Annual EMSA Meeting, San Antonio, TX, Ed. G.W. Bailey (Claitor's, Baton Rouge, LA), p. 524.
23. Colliex C. The impact of EELS in materials science. Microscopy, Microanalysis, Microstructures 1991, 2.
24. Krivanek O.L., Ahn C.C., Keeney R.B. Parallel detection electron spectrometer using quadrupole lenses. Ultramicroscopy 1987, 22:103.
25. Jeanguillaume C., Colliex C. Spectrum-image: the next step in EELS digital acquisition and processing. Ultramicroscopy 1989, 28:252.
26. Tencé M., Quartuccio M., Colliex C. PEELS compositional profiling and mapping at nanometer spatial resolution. Ultramicroscopy 1995, 58:42.
27. Isaacson M.S., Langmore J., Parker N.W., Kopf D., Utlaut M. The study of the adsorption and diffusion of heavy atoms on light element substrates by means of the atomic resolution STEM. Ultramicroscopy 1976, 1:359.
28. Mory C., Kohl H., Tencé M., Colliex C. Experimental investigation of the ultimate EELS spatial resolution. Ultramicroscopy 1991, 37:191.
29. Mory C., Colliex C. Elemental analysis near the single-atom detection level by processing sequences of energy-filtered images. Ultramicroscopy 1989, 28:339.
30. Hirahara K., Suenaga K., Bandow S., Kato H., Okazaki T., Shinohara H., Iijima S. One-dimensional metallofullerene crystal generated inside single-walled carbon nanotubes. Physical Review Letters 2000, 85:5384.
31. Zobelli A., Gloter A., Ewels C.P., Seifert G., Colliex C. Electron knock-on cross section of carbon and boron nitride nanotubes. Physical Review B 2007, 75:245402.
32. Charron G., Giusti A., Mazerat S., Mialane P., Gloter A., Miserque F., Keita B., Nadjo L., Filoramo A., Rivière E., Wernsdorfer W., Huc V., Bourgoin J.-P., Mallah T. Assembly of a magnetic polyoxometalate on SWNTs. Nanoscale 2010, 2:139.
33. Suenaga K., Iizumi Y., Okazaki T. Single atom spectroscopy with reduced delocalization effect using a 30kV STEM. European Physical Journal Applied Physics 2011, 54:33508.
34. Suenaga K., Tencé M., Mory C., Colliex C., Kato H., Okazaki T., Shinohara H., Hirahara K., Bandow S., Iijima S. Element-selective single atom imaging. Science 2000, 290:2280.
35. Krivanek O.L., Mory C., Tencé M., Colliex C. EELS quantification near the single-atom detection level. Microscopy, Microanalysis, Microstructures 1991, 2:257.
36. Leapman R.D., Rizzo N.W. Towards single atom analysis of biological structures. Ultramicroscopy 1999, 78:251.
37. Varela M., Lupini A., Christen H.M., Dellby N., Krivanek O.L., Nellist P.D., Pennycook S.J. Spectroscopic identification of single atoms within a bulk solid. Physical Review Letters 2004, 92:095502.
38. Varela M., Gazquez J., Pennycook T.J., Magen C., Oxley M.P., Pennycook S.J. Applications of aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy to complex oxide materials. Scanning Transmission Electron Microscopy: Imaging and Analysis 2011, 429. Springer. S.J. Pennycook, P.D. Nellist (Eds.).
39. Suenaga K., Sato Y., Liu Z., Kataura H., Okazaki T., Kimoto K., Sawada H., Sasaki T., Omoto K., Tomita T., Kaneyama T., Kondo Y. Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage. Nature Chemistry 2009, 1:415.
40. Suenaga K., Koshino M. Atom-by-atom spectroscopy at graphene edge. Nature 2010, 468:1088.
41. Zewail A.H., Thomas J.M. 4D Electron Microscopy: Imaging in Space and Time 2010, Imperial College Press, London.
42. Chu M.-W., Liou S.C., Chang C.-P., Choa F.-S., Chen C.H. Emergent chemical mapping at atomic-column resolution by energy-dispersive X-ray spectroscopy in an aberration-corrected electron microscope. Physical Review Letters 2010, 104:196101.
43. d'Alfonso A.J., Freitag B., Klenov D., Allen L.J. Atomic-resolution chemical mapping using energy-dispersive X-ray spectroscopy. Physical Review B 2010, 81:100101.
44. Zagonel L.F., Mazzucco S., Tencé M., March K., Bernard R., Laslier B., Jacopin G., Tchernycheva M., Rigutti L., Julien F.H., Songmuang R., Kociak M. Nanometer scale spectral imaging of quantum emitters in nanowires and its correlation to their atomically resolved structure. Nano Letters 2011, 11:568.
45. Yamamoto N., Spence J.C.H., Fathy D. Cathodoluminescence and polarization studies from individual dislocations in diamond. Philosophical Magazine B 1984, 49:609.
46. L.H.G. Tizei, M. Kociak, Spectrally and Spatially Resolved Cathodoluminescence of Nanodiamonds: Local Variations of the NV0 Emission Properties, Nanotechnology 23 (2012) 175702.