Experimental study of annular bright field (ABF) imaging using aberration-corrected scanning transmission electron microscopy (STEM)

Micron

Volumn 43, Issue 4, 2012, Pages 538-544

  Okunishi, Eiji ^a   Sawada, Hidetaka ^a   Kondo, Yukihito ^a  

^a JEOL LTD   (Japan)

Author keywords

Aberration corrected scanning transmission electron microscopy; Annular bright field image; Annular dark field imaging; Diffraction imaging; Light element

Indexed keywords

BRIGHT-FIELD IMAGES; DARK FIELD IMAGING; DIFFRACTION IMAGING; LIGHT ELEMENT; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY;

CHEMICAL ELEMENTS;

EID: 84857370297     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.10.007     Document Type: Article

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