Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

Ultramicroscopy

Volumn 111, Issue 7, 2011, Pages 865-876

  Inada, H ^a,b   Su, D ^a   Egerton, R F ^c   Konno, M ^b   Wu, L ^a   Ciston, J ^a   Wall, J ^a   Zhu, Y ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b HITACHI HIGH TECHNOLOGIES CORPORATION   (Japan)

^c UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Aberration correction; High resolution electron microscopy; Secondary electron imaging

Indexed keywords

ABERRATION CORRECTION; APPLIED BIAS; ATOMIC IMAGING; ATOMIC NUMBERS; ATOMIC SCALE; CRYSTAL SURFACES; DARK-FIELD; EXPERIMENTAL OBSERVATION; HIGH RESOLUTION; HIGH-RESOLUTION IMAGING; HITACHI; IMAGE INTENSITIES; MATERIALS CHARACTERIZATION; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SECONDARY ELECTRONS; TRANSMISSION ELECTRON MICROSCOPE; ULTRAHIGH RESOLUTION;

ATOMS; ELECTRON MICROSCOPES; HIGH RESOLUTION ELECTRON MICROSCOPY; SECONDARY EMISSION; TRANSMISSION ELECTRON MICROSCOPY; URANIUM;

ELECTRONS;

CARBON; URANIUM;

ARTICLE; ATOMIC IMAGING; CONTRAST ENHANCEMENT; CONTROLLED STUDY; ELECTRON MICROSCOPE; EQUIPMENT DESIGN; IMAGE ANALYSIS; IMAGE QUALITY; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; MOLECULAR IMAGING; OBSERVATIONAL STUDY; OPTICAL RESOLUTION; PROCESS DESIGN; SCANNING TRANSMISSION ELECTRON MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL DETECTION; SYSTEM ANALYSIS;

CARBON; ELECTRONS; ELEMENTS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; URANIUM;

EID: 80053052168     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.10.002     Document Type: Article

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