Theory and Simulations of STEM Imaging

Aberration-Corrected Analytical Transmission Electron Microscopy

Volumn , Issue , 2011, Pages 89-110

  Nellist, Peter D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Annular dark field (ADF) detector use first detection modes, by Crewe and co workers; Incoherent imaging with dynamical scattering multiple scattering, and beam propagation in sample; Most popular STEM imaging mode using ADF STEM; Scattering, over all angular ranges technique, referred as ADF STEM; STEM imaging, of crystalline materials coherence in ADF imaging, atoms in crystal lattice; Strong dynamical diffraction interpretation of coherent imaging technique, and Bloch wave analysis; Theoretical basis for image contrast in STEM imaging ADF and bright field (BF) imaging; Theory and simulations of STEM imaging; Thermal diffuse scattering (TDS) thermal lattice vibration effects, strength of Bragg beams; Z contrast imaging of single atoms and dark field imaging technique

Indexed keywords

EID: 84885570119     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9781119978848.ch5     Document Type: Chapter

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